Understanding the Self-Heating Effects Measured with the AC Output Conductance Method in Advanced FinFET Nodes.

Spoke: Spoke 6
Ambito: Ecological transition based on HPC & data technology

Autori: L. Tondelli, R. Asanovski, A. J. Scholten, T. V. Dinh, S-W. Tam, R. M. T. Pijper, L. Selmi.

Nome Rivista o serie: 2024, IEEE Transaction on Electron Devices (TED)
Editore: IEEE
Accessibilità: Restricted

Leggi qui: doi.org/10.1109/TED.2024.3469187