From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks.

Spoke: Spoke 6
Ambito: Ecological transition based on HPC & data technology

Autori: Sara Vecchi, Andrea Padovani, Paolo Pavan, Francesco Maria Puglisi.

Nome Rivista o serie: IEEE Transactions on Device and Materials Reliability
Editore: IEEE
Accessibilità: Restricted

Leggi qui: hdl.handle.net/11380/1340286