On the Output Conductance Dispersion due to Traps and Self-Heating in Large Bulk, FDSOI and FinFET nMOS Devices.

Spoke: Spoke 6
Ambito: Ecological transition based on HPC & data technology

Autori: L. Tondelli, A. J. Scholten, R. Asanovski, R. M. T. Pijper, T. V. Dinh, L. Selmi.

Nome Rivista o serie: 50th IEEE European Solid-State Electronics Research Conference (ESSERC24)
Editore: IEEE
Accessibilità: Restricted

Leggi qui: http://doi.org/10.1109/ESSERC62670.2024.10719502