MISSIONE 4
Istruzione
ricerca
Ecosister - Logo Next Gen Eu
Ecosister - Logo Mur
MISSIONE 4
Istruzione
ricerca

Characterization of annual urban air temperature changes with special reference to the city of Modena: a comparison between regression models and a proposal for a new index to evaluate relationships between environmental variables.

Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Isabella Morlini, Sean Albertson, Stefano Orlandini. Nome Rivista o serie: Stochastic Environmental Research and Risk Assessment Editore: Springer Accessibilità: Restricted Leggi qui: doi.org/10.1007/s00477-023-02622-x

Modelling local climate change using site-based data.

Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Isabella Morlini, Maria Franco Villoria, Stefano Orlandini. Nome Rivista o serie: Environmental and Ecological Statistics Editore: Springer Accessibilità: Open Access Leggi qui: doi.org/10.1007/s10651-023-00560-z

Random Walks-Based Node Centralities to Attack Complex Networks.

Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Massimiliano Turchetto, Michele Bellingeri, Roberto Alfieri, Ngoc-Kim-Khanh Nguyen, Quang Nguyen, Davide Cassi. Nome Rivista o serie: Mathematics Editore: MDPI Accessibilità: Open access, Creative Commons Attribution 4.0 licence. Leggi qui: doi.org/10.3390/math11234827

Uphill in reaction-diffusion multi-species interacting particles systems.

Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Francesco Casini, Cristian Giardinà, Cecilia Vernia. Nome Rivista o serie: Journal of Statistical Physics Editore: Springer Accessibilità: Open access, Creative Commons Attribution 4.0 licence. Leggi qui: doi.org/10.1007/s10955-023-03141-3

Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators.

Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Tommaso Zanotti, Alok Ranjan, Sean J. O’Shea, Nagarajan Raghavan, Ramesh Thamankar Vellore, Kin Leong Pey, Francesco Maria Puglisi. Nome Rivista o serie: IEEE Transactions on Device and Materials Reliability Editore: IEEE Accessibilità: Restricted Leggi qui: hdl.handle.net/11380/1340287