Reliability Analysis of RTN-based True Random Number Generators.

Spoke: Spoke 6
Ambito: Ecological transition based on HPC & data technology

Autori: Tommaso Zanotti, Alok Ranjan, Sean J. O’Shea, Nagarajan Raghavan, Ramesh Thamankar, Kin Leong Pey, Francesco Maria Puglisi.

Nome Rivista o serie: 2023 IEEE International Integrated Reliability Workshop (IIRW)
Editore: IEEE
Accessibilità: Restricted

Leggi qui: hdl.handle.net/11380/1350066