The Major Effect of Trapped Charge on Dielectric Breakdown Dynamics and Lifetime Estimation.

Spoke: Spoke 6
Ambito: Ecological transition based on HPC & data technology

Autori: Sara Vecchi, Andrea Padovani, Paolo Pavan, Francesco Maria Puglisi.

Nome Rivista o serie: 2023 IEEE International Integrated Reliability Workshop (IIRW)
Editore: IEEE
Accessibilità: Restricted

Leggi qui: hdl.handle.net/11380/1335866