Understanding the Self-Heating Effects Measured with the AC Output Conductance Method in Advanced FinFET Nodes.

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Titolo: “Understanding the Self-Heating Effects Measured with the AC Output Conductance Method in Advanced FinFET Nodes.”
Autori: L. Tondelli, R. Asanovski, A. J. Scholten, T. V. Dinh, S-W. Tam, R. M. T. Pijper, L. Selmi.

Nome Rivista o serie: 2024, IEEE Transaction on Electron Devices (TED)
Editore: IEEE
Accessibilità: Restricted

Leggi qui: doi.org/10.1109/TED.2024.3469187