Ultra-low power logic in memory with commercial grade memristors and FPGA-based smart-IMPLY architecture.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Lorenzo Benatti,Tommaso Zanotti, Paolo Pavan,Francesco Maria Puglisi. Nome Rivista o serie: Microelectronic Engineering Editore: Elsevier Accessibilità: Open access, CC BY-NC-ND 4.0 Leggi qui: hdl.handle.net/11380/1324206
Characterization of annual urban air temperature changes with special reference to the city of Modena: a comparison between regression models and a proposal for a new index to evaluate relationships between environmental variables.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Isabella Morlini, Sean Albertson, Stefano Orlandini. Nome Rivista o serie: Stochastic Environmental Research and Risk Assessment Editore: Springer Accessibilità: Restricted Leggi qui: doi.org/10.1007/s00477-023-02622-x
On wind–wave interaction phenomena at low Reynolds numbers.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: A. Cimarelli, F. Romoli, E. Stalio. Nome Rivista o serie: Journal of Fluid Mechanics Editore: Cambridge University Press Accessibilità: Open Access Leggi qui: doi.org/10.1017/jfm.2023.4
High-resolution 2D shallow water modelling of dam failure floods for emergency action plans.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Alessia Ferrari, Renato Vacondio, Paolo Mignosa. Nome Rivista o serie: Journal of Hydrology Editore: Elsevier Accessibilità: Open Access Leggi qui: doi.org/10.1016/j.jhydrol.2023.129192
Understanding the Self-Heating Effects Measured with the AC Output Conductance Method in Advanced FinFET Nodes.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: L. Tondelli, R. Asanovski, A. J. Scholten, T. V. Dinh, S-W. Tam, R. M. T. Pijper, L. Selmi. Nome Rivista o serie: 2024, IEEE Transaction on Electron Devices (TED) Editore: IEEE Accessibilità: Restricted Leggi qui: doi.org/10.1109/TED.2024.3469187
Experimental sandbox tracer tests to characterize a two-facies aquifer via an Ensemble Smoother.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Valeria Todaro, Marco D’Oria, Andrea Zanini, J.Jaime Gomez-Hernandez, Maria Giovanna Tanda. Nome Rivista o serie: Hydrogeology Journal Editore: Springer Nature Accessibilità: Open Access Leggi qui: doi.org/10.1007/s10040-023-02662-1
On the Output Conductance Dispersion due to Traps and Self-Heating in Large Bulk, FDSOI and FinFET nMOS Devices.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: L. Tondelli, A. J. Scholten, R. Asanovski, R. M. T. Pijper, T. V. Dinh, L. Selmi. Nome Rivista o serie: 50th IEEE European Solid-State Electronics Research Conference (ESSERC24) Editore: IEEE Accessibilità: Restricted Leggi qui: http://doi.org/10.1109/ESSERC62670.2024.10719502
Shining Light on Inverted Singlet−Triplet Emitters.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Matteo Bedogni, Davide Giavazzi, Francesco Di Maiolo, Anna Painelli. Nome Rivista o serie: J chem Theor and Comp. Editore: ACS Accessibilità: Open Access Leggi qui: pubs.acs.org/doi/10.1021/acs.jctc.3c01112
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Sara Vecchi, Andrea Padovani, Paolo Pavan, Francesco Maria Puglisi. Nome Rivista o serie: IEEE Transactions on Device and Materials Reliability Editore: IEEE Accessibilità: Restricted Leggi qui: hdl.handle.net/11380/1340286
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators.
Spoke: Spoke 6 Ambito: Ecological transition based on HPC & data technology Autori: Tommaso Zanotti, Alok Ranjan, Sean J. O’Shea, Nagarajan Raghavan, Ramesh Thamankar Vellore, Kin Leong Pey, Francesco Maria Puglisi. Nome Rivista o serie: IEEE Transactions on Device and Materials Reliability Editore: IEEE Accessibilità: Restricted Leggi qui: hdl.handle.net/11380/1340287
